G03500 - SEMI G35 - Specification for Test Methods for Lead Finishes on Semiconductor (Active) Devices Revision:Default Title 1-0621 (Reapproved 0424)

1-0621 (Reapproved 0424)

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3，SEMI M6

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G03500 - SEMI G35 - Specification for Test Methods for Lead Finishes on Semiconductor (Active) Devices Revision:Default Title 1-0621 (Reapproved 0424)This specification establishes uniform methods and procedures for conducting tests on lead finishes on (active device) electronic packages. Other SEMI Standards establish materials used and the finishes for them. Referenced SEMI Standards SEMI G4 Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes SEMI G18 Integrated Circuit Leadframe Materials Used in the Production of Etched Leadframes SEMI G20 Lead Finishes for